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Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
Pekin, Thomas C., Gammer, Christoph, Ciston, Jim, Minor, Andrew M., Ophus, ColinVolume:
176
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2016.12.021
Date:
May, 2017
File:
PDF, 2.17 MB
english, 2017