Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy
Kashyap, Yogesh, Wang, Hongchang, Sawhney, KawalVolume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4949004
Date:
May, 2016
File:
PDF, 8.08 MB
english, 2016