A Precise Design for Testing High-Speed Embedded Memory...

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IETE Journal of Research 2017 / 02

A Precise Design for Testing High-Speed Embedded Memory using a BIST Circuit

Zhang, Lijun, Wang, Ziou, Li, Youzhong, Mao, Lingfeng
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Language:
english
Journal:
IETE Journal of Research
DOI:
10.1080/03772063.2017.1285259
Date:
February, 2017
File:
PDF, 871 KB
english, 2017
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