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[IEEE 2016 88th ARFTG Microwave Measurement Conference (ARFTG) - Austin, TX, USA (2016.12.8-2016.12.9)] 2016 88th ARFTG Microwave Measurement Conference (ARFTG) - The impact of ENR and coaxial calibration in accurate on-wafer noise parameter testing for ultra-low noise devices
Kellogg, Kevin, Dunleavy, Larry, Skidmore, Scott, Simpson, GaryYear:
2016
Language:
english
DOI:
10.1109/ARFTG.2016.7839720
File:
PDF, 1.31 MB
english, 2016