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SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2016 - Beijing, China (Monday 9 May 2016)] Optical Measurement Technology and Instrumentation - Variable aberration generator using a high-order even aspheric singlet for testing optical surfaces

Lu, Jinfeng, Han, Sen, Tan, JiuBin, Chen, Shanyong, Xue, Shuai
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Volume:
10155
Year:
2016
Language:
english
DOI:
10.1117/12.2243814
File:
PDF, 1.13 MB
english, 2016
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