Mid-infrared ellipsometry, Raman and X-ray diffraction...

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Applied Surface Science 2017 / 2

Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1−xN/AlN/Si structures

Wang, Chennan, Caha, Ondřej, Münz, Filip, Kostelník, Petr, Novák, Tomáš, Humlíček, Josef
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Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2017.02.056
Date:
February, 2017
File:
PDF, 1.41 MB
english, 2017
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