Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries
Stoffers, Andreas, Barthel, Juri, Liebscher, Christian H., Gault, Baptiste, Cojocaru-Mirédin, Oana, Scheu, Christina, Raabe, DierkLanguage:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617000034
Date:
February, 2017
File:
PDF, 1.30 MB
english, 2017