![](/img/cover-not-exists.png)
[IEEE 2016 International Conference on Computing, Communication and Automation (ICCCA) - Greater Noida, India (2016.4.29-2016.4.30)] 2016 International Conference on Computing, Communication and Automation (ICCCA) - Analytical model for ID-VD characteristics of a triple metal double gate TFET
Bagga, Navjeet, Sarkhel, Saheli, Sarkar, Subir KumarYear:
2016
Language:
english
DOI:
10.1109/CCAA.2016.7813939
File:
PDF, 2.94 MB
english, 2016