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[IEEE TENCON 2016 - 2016 IEEE Region 10 Conference - Singapore (2016.11.22-2016.11.25)] 2016 IEEE Region 10 Conference (TENCON) - FPGA based temperature control and monitoring system for X-ray measurement instrument
Mahant, Keyur K., Patel, Amit V., Vala, Alpesh, Goswami, RiddhiYear:
2016
Language:
english
DOI:
10.1109/TENCON.2016.7848651
File:
PDF, 1.16 MB
english, 2016