TEM-Like Launch Geometries and Simplified De-embedding for...

IEEE Transactions on Instrumentation and Measurement 2017 / 4 Vol. 66; Iss. 4

TEM-Like Launch Geometries and Simplified De-embedding for Accurate Through Silicon Via Characterization

de Paulis, Francesco, Piersanti, Stefano, Wang, Qian, Cho, Jonghyun, Erickson, Nicholas, Achkir, Brice, Fan, Jun, Drewniak, James, Orlandi, Antonio
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Volume:
66
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2017.2654068
Date:
April, 2017
File:
PDF, 2.20 MB
english, 2017
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