SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2016 - Beijing, China (Monday 9 May 2016)] Optical Measurement Technology and Instrumentation - A standard model eye with micro scale multilayer structure for ophthalmic optical coherence tomography equipment
Han, Sen, Tan, JiuBin, Cao, Zhenggang, Ding, Zengqian, Hu, Zhixiong, Wen, Tao, Qiao, Wen, Liu, WenliVolume:
10155
Year:
2016
Language:
english
DOI:
10.1117/12.2247009
File:
PDF, 400 KB
english, 2016