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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 28 January 2017)] Optical Components and Materials XIV - Backside-incidence critically coupled Ge on SOI photodetector
Jiang, Shibin, Digonnet, Michel J. F., Liu, Yu-Hsuan, Wu, Tsung-Ting, Cheng, Szu-Lin, Liu, Han-Din, Lin, Chun-Chi, Chen, Hui-Wen, Lee, Ming-Chang M., Na, NeilVolume:
10100
Year:
2017
Language:
english
DOI:
10.1117/12.2251694
File:
PDF, 478 KB
english, 2017