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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Optical Manufacturing and Testing VII - Weighted least-square approach for simultaneous measurement of multiple reflective surfaces
Tang, Shouhong, Burge, James H., Faehnle, Oliver W., Bills, Richard E., Freischlad, Klaus, Williamson, RayVolume:
6671
Year:
2007
Language:
english
DOI:
10.1117/12.735151
File:
PDF, 1.01 MB
english, 2007