Analytical Model for Junctionless Double-Gate FET in Subthreshold Region
Shin, Yong Hyeon, Weon, Sungwoo, Hong, Daesik, Yun, IlguVolume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2664825
Date:
April, 2017
File:
PDF, 1.69 MB
english, 2017