Band gap measurement of Bi 2 Mo x W 1-x O 6 by low loss...

Materials Science in Semiconductor Processing 2017 / 06 Vol. 63

Band gap measurement of Bi 2 Mo x W 1-x O 6 by low loss electron energy loss spectroscopy

Morales-Cruz, Damasio, Paraguay-Delgado, Francisco, Borja-Urby, Raúl, Basurto-Cereceda, Sofía, Herrera-Pérez, Guillermo, Longo, Paolo, Malac, Marek
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Volume:
63
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2017.02.016
Date:
June, 2017
File:
PDF, 1.15 MB
english, 2017
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