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AIP Conference Proceedings [American Institute of Physics THE 10TH INTERNATIONAL CONFERENCE ON X‐RAY MICROSCOPY - Chicago, Illinois, (USA) (15–20 August 2010)] - Soft X‐ray Microscopy of Green Cements
Monteiro, P. J. M., Mancio, M., Kirchheim, A. P., Chae, R., Ha, J., Fischer, P., Tyliszczak, T.Volume:
1365
Year:
2011
Language:
english
DOI:
10.1063/1.3625376
File:
PDF, 2.48 MB
english, 2011