Electron Spin Resonance Study of Interface Trap States and...

Applied Physics Express 2011 / 7 Vol. 4; Iss. 8

Electron Spin Resonance Study of Interface Trap States and Charge Carrier Concentration in Rubrene Single-Crystal Field-Effect Transistors

Tsuji, Masaki, Arai, Norimichi, Marumoto, Kazuhiro, Takeya, Jun, Shimoi, Yukihiro, Tanaka, Hisaaki, Kuroda, Shin-ichi, Takenobu, Taishi, Iwasa, Yoshihiro
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
4
Language:
english
Journal:
Applied Physics Express
DOI:
10.1143/APEX.4.085702
Date:
July, 2011
File:
PDF, 520 KB
english, 2011
Conversion to is in progress
Conversion to is failed