[IEEE 2016 IEEE 18th Electronics Packaging Technology...

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[IEEE 2016 IEEE 18th Electronics Packaging Technology Conference (EPTC) - Singapore, Singapore (2016.11.30-2016.12.3)] 2016 IEEE 18th Electronics Packaging Technology Conference (EPTC) - Analysis of crack and dislocation of direct wafer bonded silicon diaphragm

Khoong, Ling Eng, Gan, Tai Kwee
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Year:
2016
Language:
english
DOI:
10.1109/EPTC.2016.7861487
File:
PDF, 1.94 MB
english, 2016
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