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Quantitative analysis of effective height of probes in microwave impedance microscopy
Wei, Zhun, Ma, Eric Yue, Cui, Yong-Tao, Johnston, Scott, Yang, Yongliang, Agarwal, Krishna, Kelly, Michael A., Shen, Zhi-Xun, Chen, XudongVolume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4962242
Date:
September, 2016
File:
PDF, 2.46 MB
english, 2016