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Experimental Investigation of Single-Event Transient Waveforms Depending on Transistor Spacing and Charge Sharing in 65 nm CMOS
Mitrovic, Mladen, Hofbauer, Michael, Goll, Bernhard, Schneider-Hornstein, Kerstin, Swoboda, Robert, Steindl, Bernhard, Voss, Kay-Obbe, Zimmermann, HorstYear:
2017
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2672820
File:
PDF, 638 KB
english, 2017