Comparative analysis of the thickness and electrical...

Physics of the Solid State 2017 / 1 Vol. 59; Iss. 1

Comparative analysis of the thickness and electrical conductivity of thin chalcogenide semiconductor films

Dan’shina, V. V., Kalistratova, L. F.
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Volume:
59
Language:
english
Journal:
Physics of the Solid State
DOI:
10.1134/S106378341701005X
Date:
January, 2017
File:
PDF, 3.16 MB
english, 2017
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