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Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens
Germer, S., Pietag, F., Polak, J., Arnold, T.Volume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4964701
Date:
November, 2016
File:
PDF, 3.96 MB
english, 2016