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[IEEE 2016 IEEE Energy Conversion Congress and Exposition (ECCE) - Milwaukee, WI, USA (2016.9.18-2016.9.22)] 2016 IEEE Energy Conversion Congress and Exposition (ECCE) - Comparison of deadtime effects on the performance of DC-DC converters with GaN FETs and silicon MOSFETs
Glaser, John S., Reusch, DavidYear:
2016
Language:
english
DOI:
10.1109/ECCE.2016.7854939
File:
PDF, 976 KB
english, 2016