Study of Contact Resistance in Connectors With Physical...

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IEEE Transactions on Instrumentation and Measurement 2017

Study of Contact Resistance in Connectors With Physical Simulation Using Nanofabrication

Fukuyama, Yasuhiro, Sakamoto, Norihiko, Kondo, Takaya, Onuma, Masanori, Kaneko, Nobu-Hisa
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2017.2662538
File:
PDF, 1.93 MB
english, 2017
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