[IEEE 2016 IEEE 25th North Atlantic Test Workshop (NATW) -...

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[IEEE 2016 IEEE 25th North Atlantic Test Workshop (NATW) - RI, USA (2016.5.9-2016.5.11)] 2016 IEEE 25th North Atlantic Test Workshop (NATW) - RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs

Nguyen, Joseph, Turgis, David, Bonciani, David, Lhomme, Brice, Carminati, Yann, Callen, Olivier, Guirleo, Guillaume, Ciampolini, Lorenzo, Ghibaudo, Gerard
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Year:
2016
Language:
english
DOI:
10.1109/natw.2016.14
File:
PDF, 584 KB
english, 2016
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