[IEEE 2016 IEEE 25th North Atlantic Test Workshop (NATW) - RI, USA (2016.5.9-2016.5.11)] 2016 IEEE 25th North Atlantic Test Workshop (NATW) - RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs
Nguyen, Joseph, Turgis, David, Bonciani, David, Lhomme, Brice, Carminati, Yann, Callen, Olivier, Guirleo, Guillaume, Ciampolini, Lorenzo, Ghibaudo, GerardYear:
2016
Language:
english
DOI:
10.1109/natw.2016.14
File:
PDF, 584 KB
english, 2016