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Ability of reflection high energy electron diffraction (RHEED) to observe structural modifications in ion-implanted and annealed GaAs
M. Rossi, G. Vitali, D. Karpuzov, M. Kalitzova, H. BudinovVolume:
26
Language:
english
Pages:
6
DOI:
10.1007/bf01124682
Date:
June, 1991
File:
PDF, 1.76 MB
english, 1991