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Extraction of Distance Between Interface Trap and Oxide Trap from Random Telegraph Noise in Gate-Induced Drain Leakage
Seo, Youngsoo, Yoo, Sungwon, Shin, Joonha, Kim, Hyunsoo, Kim, Hyunsuk, Jeon, Sangbin, Shin, HyungcheolVolume:
16
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2016.12238
Date:
May, 2016
File:
PDF, 717 KB
english, 2016