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Low leakage ZrO 2 based capacitors for sub 20 nm dynamic random access memory technology nodes
Pešić, Milan, Knebel, Steve, Geyer, Maximilian, Schmelzer, Sebastian, Böttger, Ulrich, Kolomiiets, Nadiia, Afanas'ev, Valeri V., Cho, Kyuho, Jung, Changhwa, Chang, Jaewan, Lim, Hanjin, Mikolajick, ThoVolume:
119
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4941537
Date:
February, 2016
File:
PDF, 875 KB
english, 2016