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Electrochemical capacitance voltage measurements in highly doped silicon and silicon-germanium alloys
Sermage, B., Essa, Z., Taleb, N., Quillec, M., Aubin, J., Hartmann, J. M., Veillerot, M.Volume:
119
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4946890
Date:
April, 2016
File:
PDF, 2.08 MB
english, 2016