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Defect-induced magnetism in SiC probed by nuclear magnetic resonance
Zhang, Z. T., Dmytriieva, D., Molatta, S., Wosnitza, J., Wang, Yutian, Helm, M., Zhou, Shengqiang, Kühne, H.Volume:
95
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.95.085203
Date:
February, 2017
File:
PDF, 1015 KB
english, 2017