Comparison of the Thermal Degradation of Heavily Nb-Doped...

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control 2017 / 3 Vol. 64; Iss. 3

Comparison of the Thermal Degradation of Heavily Nb-Doped and Normal PZT Thin Films

Yang, Jeong-Suong, Kang, YunSung, Kang, Inyoung, Lim, SeungMo, Shin, Seung-Joo, Lee, JungWon, Hur, Kang Heon
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
DOI:
10.1109/TUFFC.2017.2647971
Date:
March, 2017
File:
PDF, 650 KB
english, 2017
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