[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Fundamental statistical properties of reconstruction methodology for TDDB with variability in BEOL/MOL/FEOL applications
Wu, Ernest, Stathis, James, Li, Baozhen, Kim, Andrew, Linder, Barry, Bolam, Ronald, Bonilla, GriseldaYear:
2016
Language:
english
DOI:
10.1109/irps.2016.7574510
File:
PDF, 2.63 MB
english, 2016