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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 28 January 2017)] Silicon Photonics XII - Development of new MPPC with higher NIR sensitivity and wider dynamic range
Reed, Graham T., Knights, Andrew P., Nagano, Terumasa, Tsuchiya, Ryutaro, Ishida, Atsushi, Yamamoto, KoeiVolume:
10108
Year:
2017
Language:
english
DOI:
10.1117/12.2250199
File:
PDF, 1.05 MB
english, 2017