Microdosimetric approach to analysis of failures in systems of semiconductor devices of a single type under neutron irradiation
N. G. Goleminov, V. I. Ivanov, E. A. Kramer-AgeevVolume:
49
Language:
english
Pages:
3
DOI:
10.1007/bf01128058
Date:
December, 1980
File:
PDF, 271 KB
english, 1980