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MOVPE growth of InAsBi/InAs/GaAs heterostructure analyzed by in situ spectral reflectance
Boussaha, R., Fitouri, H., Rebey, A., El Jani, B.Volume:
28
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-017-6595-1
Date:
June, 2017
File:
PDF, 1.44 MB
english, 2017