SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Wednesday 12 October 2016)] Optical Metrology and Inspection for Industrial Applications IV - Corner detection and sorting method based on improved Harris algorithm in camera calibration
Han, Sen, Yoshizawa, Toru, Zhang, Song, Xiao, Ying, Wang, Yonghong, Dan, Xizuo, Huang, Anqi, Hu, Yue, Yang, LianxiangVolume:
10023
Year:
2016
Language:
english
DOI:
10.1117/12.2245973
File:
PDF, 941 KB
english, 2016