Surface roughness characterisation using optical feedback...

Electronics Letters 2017 / 02 Vol. 53; Iss. 4

Surface roughness characterisation using optical feedback interferometry

Herbert, J., Bertling, K., Taimre, T., Rakić, A.D., Wilson, S.
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Volume:
53
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el.2016.4134
Date:
February, 2017
File:
PDF, 226 KB
english, 2017
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