X-ray Diffraction and Rietveld Refinement in Deferrified...

  • Main
  • 2017 / 02
  • X-ray Diffraction and Rietveld Refinement in Deferrified...
Journal of Forensic Sciences 2017 / 02

X-ray Diffraction and Rietveld Refinement in Deferrified Clays for Forensic Science

Prandel, Luis V., Melo, Vander de F., Brinatti, André M., Saab, Sérgio da C., Salvador, Fábio A. S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Journal of Forensic Sciences
DOI:
10.1111/1556-4029.13476
Date:
February, 2017
File:
PDF, 497 KB
english, 2017
Conversion to is in progress
Conversion to is failed