A statistical study to identify the effects of packaging...

Microelectronics Reliability 2017 / 04 Vol. 71

A statistical study to identify the effects of packaging structures on lumen reliability of LEDs

Chen, Qi, Hu, Run, Luo, Xiaobing
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Volume:
71
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.02.011
Date:
April, 2017
File:
PDF, 612 KB
english, 2017
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