Absolute thermal expansion measurements of single-crystal...

Absolute thermal expansion measurements of single-crystal silicon in the range 300–1300 K with an interferometric dilatometer

M. Okaji
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Volume:
9
Language:
english
Pages:
9
DOI:
10.1007/bf01133277
Date:
November, 1988
File:
PDF, 339 KB
english, 1988
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