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Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements
Sinsheimer, John, Bouet, Nathalie, Ghose, Sanjit, Dooryhee, Eric, Conley, RayVolume:
23
Language:
english
Journal:
Journal of Synchrotron Radiation
DOI:
10.1107/S1600577516013084
Date:
November, 2016
File:
PDF, 1.46 MB
english, 2016