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[IEEE 2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT) - Dalian, China (2016.10.22-2016.10.23)] 2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT) - An IoT inspired semiconductor Reliability test system integrated with data-mining applications
Tang, Tyler Junyao, Chung, Andrew, Zhao, Atman, Kang, Randy, Zhang, Mark, Chien, Kary, Jungang Yang,, Jie Zhang,Year:
2016
Language:
english
DOI:
10.1109/CCIOT.2016.7868314
File:
PDF, 3.42 MB
english, 2016