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Measuring the Minority-Carrier Diffusion Length ofn-Type In0.53Ga0.47As Epilayers Using Surface Photovoltage
Li, Ping, Tang, Hengjing, Li, Tao, Li, Xue, Shao, Xiumei, Pavelka, Tibor, Huang, Li, Gong, HaimeiVolume:
46
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-016-5124-y
Date:
April, 2017
File:
PDF, 1.04 MB
english, 2017