SPIE Proceedings [SPIE Second International Conference on Photonics and Optical Engineering - Xi'an, China (Friday 14 October 2016)] Second International Conference on Photonics and Optical Engineering - Ray-tracing analysis of a snapshot imaging polarimeter using modified Savart polariscopes
Zhang, Chunmin, Asundi, Anand, Zhang, Jing, Cao, Qizhi, Chen, Mingxian, Xu, Yanhua, Ting, Deng, Fan, DongXinVolume:
10256
Year:
2017
Language:
english
DOI:
10.1117/12.2257840
File:
PDF, 409 KB
english, 2017