Detection of defect populations in superhard semiconductor...

Detection of defect populations in superhard semiconductor boron subphosphide B 12 P 2 through X-ray absorption spectroscopy

Huber, S. P., Gullikson, E., Meyer-Ilse, J., Frye, C. D., Edgar, J. H., van de Kruijs, R. W. E., Bijkerk, F., Prendergast, D.

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Volume:

Year:

2017

Language:

english

Journal:

J. Mater. Chem. A

DOI:

10.1039/c6ta10935g

File:

PDF, 2.90 MB

english, 2017

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