Improved Genetic Algorithm to Reduce Mutation Testing Cost

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IEEE Access 2017

Improved Genetic Algorithm to Reduce Mutation Testing Cost

Bashir, Muhammad Bilal, Nadeem, Aamer
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Year:
2017
Language:
english
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2017.2678200
File:
PDF, 766 KB
english, 2017
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