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[IEEE 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - Abu Dhabi, United Arab Emirates (2016.10.16-2016.10.19)] 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - ESD protection design for high-speed applications in CMOS technology
Chen, Jie-Ting, Lin, Chun-Yu, Chang, Rong-Kun, Ker, Ming-Dou, Tzeng, Tzu-Chien, Lin, Tzu-ChiangYear:
2016
Language:
english
DOI:
10.1109/MWSCAS.2016.7870016
File:
PDF, 734 KB
english, 2016