Parametric Characterization of TES Detectors Under DC Bias

IEEE Transactions on Appiled Superconductivity 2017 / 6 Vol. 27; Iss. 4

Parametric Characterization of TES Detectors Under DC Bias

Chiao, Meng P., Smith, Stephen James, Kilbourne, Caroline A., Adams, Joseph S., Bandler, Simon R., Betancourt-Martinez, Gabriele L., Chervenak, James A., Datesman, Aaron M., Eckart, Megan E., Ewin, Au
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Volume:
27
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/TASC.2016.2645164
Date:
June, 2017
File:
PDF, 845 KB
english, 2017
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