![](/img/cover-not-exists.png)
Operational frequency degradation induced trapping in scaled GaN HEMTs
Ubochi, Brendan, Faramehr, Soroush, Ahmeda, Khaled, Igić, Petar, Kalna, KarolVolume:
71
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.02.008
Date:
April, 2017
File:
PDF, 2.00 MB
english, 2017