[IEEE 2016 IEEE 59th International Midwest Symposium on...

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[IEEE 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - Abu Dhabi, United Arab Emirates (2016.10.16-2016.10.19)] 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - Error analysis and reliability metrics for software in safety critical systems

Lockhart, Jonathan, Purdy, Carla, Wilsey, Philip A.
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Year:
2016
Language:
english
DOI:
10.1109/mwscas.2016.7869962
File:
PDF, 170 KB
english, 2016
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